International Center for Multiscale Characterization

Capabilities The characterization techniques and tools available through the International Center for Multiscale Characterization (ICMC) span some 10 orders of magnitude in length. The chart indicates the lower range of resolution for some of our primary tools, and the chart provides further detail on the properties measured as well as sensitivity and sample size. For handy reference, at the bottom of the page, we list the full names for acronyms of common tools.


AES              Auger electron spectroscopy

AFM             atomic force microscopy

APT              atom probe tomography

Auger           Auger electron spectroscopy

CL                cathodoluminescence

D-SIMS        dynamic secondary-ion mass spectrometry

EBIC            electron-beam induced current

EDS             energy-dispersive X-ray spectroscopy

EELS           electron energy-loss spectroscopy

ESCA           electron spectroscopy for chemical analysis

ESEM          environmental scanning electron microscopy

FIB              focused ion beam

FTIR            Fourier transform infrared spectroscopy

HRSTEM     high-resolution scanning transmission electron microscopy

LA-ICPMS   laser ablation-inductively coupled plasma mass spectrometry

LEXES         low-energy electron induced X-ray emission spectroscopy

LIT               lock-in thermography

OP               optical profilometry

PL                photoluminescence

Raman        Raman spectroscopy

RBS             Rutherford backscattering spectrometry

RTX             real-time X-ray

SAM             scanning acoustic microscopy

STEM           scanning transmission electron microscopy

TEM             transmission electron microscopy

TOF-SIMS   time-of-flight secondary-ion mass spectrometry

TXRF           total reflection X-ray fluorescence

UPS             ultraviolet photoelectron spectroscopy

XPS             X-ray photoelectron spectroscopy

XRD            X-ray diffraction

XRF            X-ray fluorescence

XRR            X-ray reflectivity

XRT            X-ray diffraction tomography